Development of ionization chamber for in-line intensity monitoring of large profile parametric X- ray beam

An in-line ionization chamber has been developed for the real-time measurement of the absolute intensity of the pulsed parametric X-ray (PXR) beam during irradiation experiments. The quasi-monochromatic PXR generating system was developed at the Laboratory for Electron Beam Research and Application (LEBRA) in Nihon University. In contrast to typical narrow X-ray beams in synchrotron radiation facilities, the PXR beam profile is as large as approximately 100 mm in diameter with rather uniform flux distribution at the X-ray output port in the experimental hall. The energy of the PXR beam ranges from 5 to 34 keV, which is specified by the PXR target crystal plane and its geometrical condition. The ionization chamber is of a plane parallel type employing 6-μm thick double-sided aluminum vapor-deposited polyester films for the plane electrodes through which the X-ray beam passes. The plane bias electrode has been placed at an equal distance of 25 mm from the two plane earth electrodes that act as the beam windows with an aperture diameter of 120 mm. Due to the pulsed property of the PXR beam and the geometrical configuration of the ionization chamber, the charge-sensitive preamplifier output pulse height represents an integral of the fast electron current, corresponding to a half of the total ionization charge produced by the beam. The intensity of the PXR beam has been measured for various X-ray energies by using nitrogen and argon, respectively, as the filling gas.